JEENOCE's Semiconductor X-ray Inspection System creates unbeatable ultra high resolution images.
The in-house designed, high performance Dual Mode NT4 X-ray tube and the Onyx detector provide visibility of even the tiniest detail and finding the defects immediately.
Nothing can hide anymore.
The X-ray inspection system establishes a new benchmark for 3D/2D manual inspection in back-end semiconductor applications, offering enhanced resolution capabilities.
By integrating revolutionary Onyx® detector technology, this system achieves unparalleled image clarity and minimized noise interference, delivering inspection accuracy and operational efficiency at unprecedented levels.
Beyond its cutting-edge hardware components, the X-ray inspection system features the latest Dual Mode Quadra NT4® tube, designed to maximize operational flexibility.
With selectable brightness and resolution modes, operators can seamlessly adapt settings to meet evolving application demands—ensuring precision across diverse inspection scenarios.
Complementing its advanced engineering, the X-ray inspection system incorporates the newly developed Revalution™ software platform.
Tailored for high-end semiconductor workflows, this intuitive software streamlines data analysis through an optimized interface and intelligent automation.
Users benefit from accelerated decision-making, reduced manual intervention, and measurable gains in productivity.
This advanced X-ray inspection system delivers unparalleled ultra-high resolution imaging capabilities.
Equipped with a proprietary high-performance X-ray tube and precision detector, the equipment ensures exceptional visibility of even the most minute details while enabling immediate defect identification.
No imperfection remains undetectable.
• Enhanced Operational Speed
• Reduced Operational Noise
• Higher Image Clarity
• Superior Imaging Clarity
• Improved User-Friendliness
• Streamlined Workflow
• Enhanced System Stability
• Intuitive User Experience
• Ultra-Wide Curved Display
Engineered for high-precision semiconductor inspection, featuring a high-performance dual-mode X-ray tube and advanced high-speed detector.
Delivers micron-level defect detection with exceptional resolution to reveal microscopic details.
Nordson’s latest generation X-ray source delivers enhanced performance through its patent-pending automatic Dual Mode technology, integrated seamlessly into their cutting-edge X-ray inspection system.
This innovation enables the tube to intelligently switch between two optimized modes:
• High-Resolution Mode – Perfect for analyzing sensitive semiconductor samples with exceptional detail.
• High-Flux Mode – Designed to penetrate denser, thicker materials while maintaining image integrity.
With Dual Mode, the system achieves unparalleled clarity in defect detection, revealing microscopic imperfections with precision never before attainable in X-ray inspection.
Nordson's brand new Revalution™ software has everything under control with its modern GUI design and optimized workflow.
Revalution™ has many new and optimized features including:
Layout flexibility
Annotations & measurements
Filtering and Imaging
Main tool bar
Designed in-house by a team of semiconductor experts Onyx™ delivers state-of-the-art performance.
Using world-class pixel specifications for low dose sensitivity & high saturation dose.
Onyx™ has higher frame rates and lower noise, giving you faster images with the highest clarity and brilliance.
QuadraNT™ tubes use filament free technology for continuous service.
Eliminate the risks of oil contamination in the X-ray tube, oil spills or leaks into the work environment.
QuadraNT uses an oil free ion pump to maintain X-ray tube vacuum which never requires an oil change.
Stable performance is guaranteed since the filament is never changed.
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